This is a condensed version of HTEM database downloaded via HTEM API from National Renewable Energy Laboratory. Due to network constraints, all entries without XRD entries are discarded.

Dataset Overview

The index file contains experiment conditions of 1400+ experiments performed by the high-throughput experiment platform in NREL. Each experiments contains 44 samples, whose associated data are stored in the samples folder. The 44 samples in each experiment all have different thin film thickness and composition. Depending on the experiment setup, the sample data files may contain data from X-ray Fluorescence (thin film composition), X-ray Diffraction (crystalline structure), electronic measurement (thin film conductivity), and optical spectra (light absorption).

This dataset provides a complete record of experimental condition, structural characterization, and properties measurement, making it a valuable resource for data-mining for a better understanding of complex process-structure-property relationships in thin film materials.

Please cite: A. Zakutayev, N. Wunder, M. Schwarting, J. D. Perkins, R. White, K. Munch, W. Tumas and C. Phillips, Sci Data 5, 180053 (2018).